| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8fc0668fd5cbfe23cea7d9bdd5de932a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-072
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-616
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-3037
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-1016
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-07
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21G1-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-074
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-4258 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-221
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2208
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G21G1-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
| filingDate |
2014-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_72b76aaaec6e3e816b4176822429ab63
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c8e78a524c96bff91e2085cfc279f265 |
| publicationDate |
2015-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2015089580-A1 |
| titleOfInvention |
Improved method for rapid analysis of gold |
| abstract |
A method to determine a concentration of a target element in a sample is provide. The method comprises (i) positioning a sample containing a target element with respect to a reference material containing a reference element, (ii) simultaneously irradiating the sample and the reference material with Bremsstrahlung X-rays to thereby produce activated nuclei in the target element and to produce activated nuclei in the reference element, (iii) detecting deactivation gamma-rays' from the irradiated sample and deactivation gamma-rays from the irradiated reference material, (iv) determining a first number of detected deactivation gamma-rays from the irradiated sample and a second number of detected deactivation gamma-rays from the reference material, and (v) determining the concentration of the target element in the sample by first normalising the first number of detected deactivation gamma-rays from the irradiated sample by the second number of detected deactivation gamma-rays from the reference material. The variation of the reference element to target element cross section ratio over a range of electron beam energies is less than a predetermined measurement accuracy. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11456147-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022047537-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3329302-B1 |
| priorityDate |
2013-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |