http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2014180491-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5359ca7c4c1b3272bd4b0452d5f8762d |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-549 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-70 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-56 |
| filingDate | 2013-10-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1d012389737f5b0bfad50691adda61da http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f378922ccbd261abeb8c95737bea295e |
| publicationDate | 2014-11-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2014180491-A1 |
| titleOfInvention | Analysis device and analysis method for detecting characteristics of a material in a component sample |
| abstract | The invention relates to an analysis device (100) for detecting characteristics of at least one material contained in at least one component sample (1), said device comprising: a measuring device (10) which is used to detect optical and/or electrical measured values in the component sample (1); a simulation and evaluation device (20), designed to adapt a simulation function, which contains the characteristics of the component sample (1) as parameters, to the optical and/or electrical measured values; and an output device (30), designed to output the material characteristics from the adapted simulation function. In addition, the analysis device is provided with a preparation device (80), designed to produce the at least one component sample (1), and a controller (40), which is used to control the preparation device (80) and at least one of the measuring device (10) and the simulation and evaluation device (20) according to a stored control function. Also disclosed is a method for detecting characteristics of at least one material contained in a component sample (1). |
| priorityDate | 2012-10-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 18.