http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2014045649-A1

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publicationDate 2014-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2014045649-A1
titleOfInvention Attached matter inspection device
abstract Identification of sample fine particles attached to an inspection object is performed simply and with high accuracy, while operation rates are increased and device size is decreased. Compressed gas is blown via an air nozzle against an inspection object transported into a sampling chamber defined by a pair of side walls and an upper wall that encloses a part of a transport path of a transport unit. Sample fine particles that have been removed are suctioned into a collector, and the sample fine particles are separated from the suctioned gas and analyzed. The air nozzle is disposed on one of the side walls of the sampling chamber, and the collector is disposed under the other side wall as a container independent from the sampling chamber.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11371915-B2
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Total number of triples: 29.