http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2013144741-A1
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_902108baba3094b7fec2981d9e3cfa7f http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3794acc6e73c44f30aaea9f28e5e84b5 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-183 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-18308 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S3-08059 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S3-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-288 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-18344 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-0207 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-1042 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01S5-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01S5-183 |
filingDate | 2013-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d22eab2a5337730c1cb5cad9045aa2e3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bdf5d8406be64868a1917efd72be7907 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_353c4171aa87665e54d58b6075498382 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_45b6691ce49db2764cfac9e03f023383 |
publicationDate | 2013-10-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | WO-2013144741-A1 |
titleOfInvention | Vertical microcavity with curved surface defects |
abstract | A vertical microcavity (1) has a layer structure perpendicular to a vertical axis z, the layer structure comprising: a first reflector (100) and a second reflector (200), each comprising one or more material layers (111-131, 211-231) and being preferably a Bragg reflector, a confinement layer (10) separating the first and second reflectors, wherein an electromagnetic wave can be substantially confined, and wherein, the confinement layer comprises a body (12) and a defect (20), said defect delimited by two surfaces, a first surface (si) and a second surface (s 2 ), each of said two surfaces being perpendicular to the vertical axis z, wherein, one (si) of said two surfaces is contiguous with said body (12), the other one (s 2 ) of said two surfaces being contiguous with a layer (211) of the first or second reflector, and wherein one (s 1 ) of said two surfaces is curved, such as to have a curved profile (21, 21', 22) in at least a plane section ((y, z), (x, z)) perpendicular to the layer structure, said curved profile having a vertex (25), which defines a maximal thickness h 0 of the defect between the first surface and the second surface in said plane section, said maximal thickness h 0 being less than a thickness of said contiguous layer (211). |
priorityDate | 2012-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 29.