http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2013144290-A1
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_df74e7352f6daaa16002eec3eefa92de |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01S13-887 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01S13-89 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01S7-411 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01S7-41 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01S7-41 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01S13-89 |
filingDate | 2013-03-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_647e57258fe2a1e358785cd71fe15646 |
publicationDate | 2013-10-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | WO-2013144290-A1 |
titleOfInvention | Method and device for detecting structures in an object to be examined |
abstract | The invention relates to a method for detecting structures (41, 42) such as edges and material transitions on and/or in an object (40) to be examined, said method comprising an antenna device that emits microwave signals and detects the signals reflected by the object (40) to be examined in magnitude and phase. A 3-dimensional image of the object (40) to be examined is reconstructed therefrom at sampling points of the object to be examined. The method operates by means of the following steps: determining a spatial position of a structure (41, 42) from the magnitude of the reflected signal; determining the sign of the reflection coefficient of the reflected signal at the spatial position of the structure (41, 42); and identifying structures (41, 42) on the basis of the spatial arrangement of the sign of the reflection coefficient. |
priorityDate | 2012-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.