http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2012169831-A2

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067
filingDate 2012-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_85a84e0175228b8bb6afbbe8d1d19a19
publicationDate 2012-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2012169831-A2
titleOfInvention Probe apparatus for testing chips
abstract The present invention relates to a probe apparatus for testing the quality of semiconductor chips, wherein the probe apparatus for testing the chips has superior reliability and durability. The probe apparatus of the present invention comprises: a printed circuit board having a center with a through-hole; a pin holder which is attached to the front surface of the printed circuit board and which has a plurality of pin holes; a plurality of probe pins each of which has an L-shape with a horizontal end connected to one side end of a circuit pattern formed on the printed circuit board, and a vertical end exposed outwardly from the upper surface of the pin hole; and a back cover attached to the back surface of the printed circuit board.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014253163-A1
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priorityDate 2011-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 32.