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publicationDate 2011-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2011156049-A1
titleOfInvention High voltage chuck for a probe station
abstract A chuck for testing an integrated circuit includes an upper conductive layer having a lower surface and an upper surface suitable to support a device under test. An upper insulating layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper conductive layer, and a lower surface. A middle conductive layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper insulating layer, and a lower surface.
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