| abstract |
According to an exemplary embodiment of the present disclosure, apparatus and method can be provided for generating information for at least one structure. For example, using at least one first arrangement, it is possible to receive at least one first radiation from the at least one structure and at least one second radiation from a reference, and interfere the first and second radiations to generate at least one third radiation. Further, with at least one second arrangement, it is possible to generate spectroscopic data as a function of the at least one third radiation, and reduce at least one scattering effect in the spectroscopic data to generate the information. In addition or as an alternative, according to a further exemplary embodiment of the present disclosure, it is possible to classify a type of the structure based on the spectroscopic data to generate the information. |