| abstract |
The present invention relates to a method for sensing at least one microwave (mw) magnetic field polarization component of a mw field generated by a mw device, like e.g. a method for sensing a spatial distribution of mw magnetic field polarization components of a mw device under examination. Furthermore, the present invention relates to a sensor device being configured for conducting the above method. Applications of the invention are available in the fields of examining and engineering mw devices, like e.g. monolithic mw integrated circuits (MMICs / RFICs), electronic mw components, high-frequency circuits or mw antenna devices. |