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filingDate 2011-01-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c69668b6bb7015b1bb7a49a4873f2db8
publicationDate 2011-07-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2011086051-A1
titleOfInvention Integrated silicon circuit comprising a physically non-reproducible function, and method and system for testing such a circuit
abstract The invention relates to an integrated silicon circuit that comprises a physically non-reproducible LPUF function enabling the generation of a signature specific to said circuit. Said function comprises a ring oscillator consisting of a loop (502) through which a signal e flows, said loop consisting of N topologically identical delay channels (500, 501), connected to each other in series and an inversion gate (503), wherein a delay channel (500, 501) consists of M lag elements (506, 507) connected to each other in series. The function also comprises a control module (505) that generates N control words (C1, C2), said words being used for configuring the value of the lag inserted by the delay channels on the signal e flowing therethrough. A measuring module (504) measures the signal frequency at the output of the last delay channel (501) after updating the control words, and means for deriving the measurements of the frequencies of the bits forming the circuit signature. The invention also relates to a method and system for testing such circuits.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2015036881-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013046334-A
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2016510498-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107276761-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2014100647-A1
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priorityDate 2010-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 38.