http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2011026168-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_aa4c257b8cb9421259273b88e7857290 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_95ea3022243daf82f3c385a4a7a959f7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0b8610e1ed247d96c13f5acb0a63db79 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10024 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30201 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-586 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-60 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-514 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06V10-60 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-60 |
| filingDate | 2010-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0c7c814ee042aacb5063beb61b05018b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a603d85c4fd63d68782093d7861cc44f |
| publicationDate | 2011-03-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2011026168-A1 |
| titleOfInvention | Estimating reflectance model parameters from an image |
| abstract | The disclosure concerns processing of electronic images, such as hyperspectral, multispectral or trichromatic images. In particular, but is not limited to, a method, software and computer for estimating parameters of a reflectance model applied to an image is disclosed. Examples of processing of the images using the estimated parameters includes material recognition, recolouring and re-shading of objects represented in the image. That is, a computer implemented method is provided of estimating one or more of photogrammetric parameters, Ω( n u n ) surface shape N and index of refraction n n ( n u, n λ) represented in a reflectance image having one or more known illumination directions L and a known viewing direction V , the method comprising optimising (802) the difference between the reflectance image and a reflectance model, the reflectance model being based on surface shape N ; the material index of refraction n n ( n u, n λ) and a set of photogrammetric parameters Ω( n u n ) . |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107644453-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107644453-A |
| priorityDate | 2009-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID127811630 |
Total number of triples: 23.