| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4633b932bd0f028d5ddbb73ba1762f60
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2dff902f580792a5b5b5e40f1e29bfd6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6af181080240f580e5c86666ac7191d1 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11B33-144
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11B33-128 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B20-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-677 |
| filingDate |
2010-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_42b0c7f2ea2d2e8da0efbec28f486d43
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6a82d2558f12ac5e67b4c6594f14d16d |
| publicationDate |
2011-01-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2011008943-A2 |
| titleOfInvention |
Storage device temperature sensing |
| abstract |
A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device transporter. The test slot assembly also includes a temperature sensing assembly. The temperature sensing assembly is arranged to measure a temperature of a storage device by way of physical contact. The test slot assembly also includes a clamping mechanism operatively associated with the housing. The clamping mechanism is operable to move the temperature sensing assembly into contact with a storage device. |
| priorityDate |
2009-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |