| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_44997184eb89e9fd89f3546dfd80f1b9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b992c5d82de52547ebdcd34887ee5462
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d2d63bfa65e4f74cd18b97e2addec5a4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a4122273f7c29a92469c19dcfd5638c8 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-53
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-4738
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8422 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-49
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-02 |
| filingDate |
2010-06-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_088531f7f208ce5b529f712768e0d9fb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f29e770a771f1c09c23aa1d104a4d97f |
| publicationDate |
2010-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2010149885-A1 |
| titleOfInvention |
Improved particle size analyzer |
| abstract |
The present invention relates to a device for measuring the intensity of light scattered by a thin film of a colloidal medium, comprising: a monochromatic light source; a convergent optical system focusing said light source onto the thin film to be analyzed and comprising a dioptric element (7), one of the faces of which constitutes a first wall delimiting the thin film; at least one photosensitive detector reacting to the light scattered or backscattered by the thin film; and means for processing the signal coming from the photodetector. According to the device, the other, second wall is formed by a plane surface (3) on the end of a rod (2). |
| priorityDate |
2009-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |