| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_34167c8caaf9a04ab6fcf543d6dec18c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_86cb36b08cfdcbcc69bb13700e863e7a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_02de6ed1b2f41ca2294b87a9f21cabc1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8332daca354767261b4761e167cf65af
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9d08f3ab00c8139a2cfde7794a8c8ede |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2837 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R23-16 |
| filingDate |
2010-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b8e514e7a3b17e724fc4604f56055cad
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e1792e363652afe72561e2efd9a06bbf
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7caf24517570cb4f2e2d7a6975a5634
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_520ebe335c2a0be74e4fef172f3b645a |
| publicationDate |
2010-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2010144857-A2 |
| titleOfInvention |
Method of detecting system function by measuring frequency response |
| abstract |
Methods of rapidly measuring the impedance spectrum of an energy storage device in-situ over a limited number of logarithmically distributed frequencies are described. An energy storage device is excited with a known input signal, and the response is measured to ascertain the impedance spectrum. The excitation signal is a limited time duration sum-of-sines consisting of a select number of frequencies. In one embodiment, magnitude and phase of each of frequency of interest within the sum-of-sines is identified when the selected frequencies and sample rate are logarithmic integer steps greater than two. This technique requires a measurement with a duration of one period of the lowest frequency. In another embodiment, where the selected frequencies are distributed in octave steps, the impedance spectrum can be determined using a captured time record that is reduced to a half-period of the lowest frequency. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11422102-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11054481-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11709219-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11519969-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10901044-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10379168-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9851414-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10345384-B2 |
| priorityDate |
2004-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |