| abstract |
The invention concerns an arrangement for measuring parameters characterizing surfaces in particular mass. Specifically, the invention concerns an arrangement for measuring parameters characterizing surfaces which may be used in combination with an optical measurement technique. The arrangement comprises at least two electrodes (2a, 2b), at least one piezoelectric sensor (3) located at a distance from the electrodes (2a, 2b), wherein each electrode is arranged with at least one optically transparent region (4). In an aspect of the invention, the arrangement combines a quartz crystal microbalance with dissipation monitoring (QCM-D) with a localized surface plasmon resonance sensor (LSPR sensor). |