| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4542af9a63d18ced290011a09d4b8c69
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8cd26cbc9109efa31aa1f39f0a877835
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9fc7063448393b9a2cf576ad54bb3031 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-50 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-308 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-308 |
| filingDate |
2010-03-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_57d0a7fc62c6ddd2f9d3022a8ec61dd7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_148a7fe4bc8c82bdc056a84031faf058 |
| publicationDate |
2010-11-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2010099964-A3 |
| titleOfInvention |
Method and apparatus for measurement of ohmic shunts in thin film modules with the voc-ilit technique |
| abstract |
The invention refers to a method for the detection of ohmic shunts in a thin film solar cell, especially thin film silicon photovoltaic modules, wherein the solar cell is light stimulated and thermal effects caused by the shunts are detected using Lock-in Thermography as well as an apparatus to detect ohmic shunts in thin-film solar cells. According to the inventive method, the solar cell is light stimulated and thermal effects caused by the shunts are detected using Lock-in Thermography, wherein the solar cell is stimulated with light of at least two different wavelengths. |
| priorityDate |
2009-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |