| abstract |
The presented invention relates to a needle-shaped ion-selective solid contact microelectrode with the length of the measuring point preferably but not limited to equal or less than 10 micron, particularly 0.5 - 10 micron, a method for producing such an electrode and use of an ion-selective solid contact microelectrode as a working electrode in different scanning measuring systems, such as SECM, SIET, MIFE and others, for measuring activity (concentration) of different ions in the modes of three-dimensional gradient scanning, plane two-dimensional scanning, vertical or horizontal profiling, one point measurements or any other point by point measurements over an active surface. For example, the present invention aims to substitute the glass-capillary microelectrodes used in localized measurements. The microelectrode of presented invention differs in its principles of construction and production opposed to that of solid-contact ion-selective electrodes. The invention describes a needle-shaped rigid electrically-conductive substrate (1); an insulation layer (4), except in the tip of said substrate (3); an electrically-conductive layer (6); and a layer of ion-selective membrane (7). |