| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_af17de323b99611ce2541cd85709fb50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f8dfd5447275bea4b74d914224d6f207
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3cd49faef11bc9a137188d670f9773ce
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_142d981bd6c180968f769e0da8f620da
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8b7b95718fdeef8404d75dfefcb7308f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_827e12088b01ba11a7e825738d25a2dd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_86314becab6850aebe7dc2e6004b531a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4f824ff685eab039b312da21dc75a838 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20025 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-20 |
| filingDate |
2009-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bd04194ca02673bf41ef604b6fb2bb59
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59916d446f3a2e9dd9ecf307283466b1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2284d6c4d3ba439fd70c576070858449
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cbec93d89f4b38d608b9edf0a5ac2354
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_38fd12f5675b787e1dd9ee2b13162666
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e6082bbc78fbbb152003a694c5a184c0 |
| publicationDate |
2010-04-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2010044544-A2 |
| titleOfInvention |
Sample holder for measuring residual stress and method for quantitatively analyzing crystal phase using the same |
| abstract |
The present invention relates to a sample holder used in an X-ray diffraction analysis device, more specifically to a standard sample holder for measuring the lattice constant of unknown powder samples. The sample holder is used to determine the lattice constant of unknown powder samples by comprising the steps of: forming a plate-shaped holder body with standard materials of which the lattice constants are known; filling the powder samples into installation grooves formed on the upper surface of the holder body and obtaining a diffraction pattern from mixed samples in which the standard materials are mixed with the unknown samples; and correcting the interplanar spacing of the unknown samples based on the interplanar spacing of the standard materials which show the accurate lattice constant thereof. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114088749-A |
| priorityDate |
2008-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |