| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ec9ba860531b93052d367089ce4bc09e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dc3e639586089fe232d0cfb27383c875
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0d54724ae9e3a5f143a97b8bbddbf295 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02818
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0426 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N9-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-2437
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N11-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N9-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-036
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-022 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N11-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N5-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N9-00 |
| filingDate |
2009-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fdbf543ffe755fd11b5a9ec692fa28fb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_660447056ed2f865f25b8afea0edd857 |
| publicationDate |
2009-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2009139418-A1 |
| titleOfInvention |
Quartz oscillator and measurement method using same |
| abstract |
Disclosed is a quartz oscillator, and a measurement method using the same, which make it possible to measure only the density of a solution, or to measure the density and viscosity simultaneously, by means of a quartz oscillator equipped with one detection unit. Electrodes are provided on both sides of a piezoelectric plate, a substance to be measured is brought into contact with a quartz oscillator in which an uneven surface is formed on the electrode or the detection unit of an electrode on the side that comes into contact with the substance to be measured, the quartz oscillator is caused to oscillate, and the density of the aforementioned substance is measured by measuring the amount of change in a frequency (f2) that corresponds to the high-frequency side of two frequencies that represent a value that is half of the maximum value of the conductance of the aforementioned quartz oscillator. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011203246-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106153718-A |
| priorityDate |
2008-05-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |