http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009130737-A1

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publicationDate 2009-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2009130737-A1
titleOfInvention Substrate for inspection, method for manufacturing substrate for inspection, and inspection method using the substrate for inspection
abstract On a surface of a substrate, a plurality of recessed sections are formed. The respective inner surfaces of the recessed sections are covered with electrically conductive films. The electrically conductive films are brought into contact with the bumps of a semiconductor element under inspection and are connected electrically with the bumps. This prevents the bumps from being damaged due to contact with a probe needle.
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