| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7b40520b84fb3857860be339d6593618
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_614267c511538899582d72535e2e2fa8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d514a01fd01db392b75cd524a283245f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_268be9afa00cf55b5aa72b1612151ecb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_59e7f18e1bd9cc8730025e2328018b8f |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2863
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01R12-7076
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01R13-2414
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01R12-7082
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0735 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R11-01 |
| filingDate |
2009-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e032ed8522c571b1ea1fcc3e4c3e277
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fb54a28c8eeb7a7db8d147656d1fcfd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_553dd7e1ab4fd1472028398783ca0266
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1c9570c415bca4710660df909ab53b79 |
| publicationDate |
2009-09-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2009113486-A1 |
| titleOfInvention |
Probe guard |
| abstract |
Disclosed is a probe guard that has good connection stability between test electrodes and electrodes to be tested, even after being exposed to high temperatures due to a burn-in test. Even after repeated use of the probe guard, contact between the test electrodes and a conduction unit, and contact between the conduction unit and a probe contact needle or the electrodes to be tested are less susceptible to displacement. The probe guard comprises a test circuit board that has test electrodes formed so as to correspond to the electrodes to be tested; and an anisotropically conductive member that electrically connects the electrodes to be tested with the test electrodes. The test electrodes are provided so that at least the tips thereof protrude from the surface of the test circuit board. The anisotropically conductive member is provided with a plurality of conductive paths configured from conductive members that penetrate an insulating base material, which comprises an anodic oxide film of an aluminum substrate that has micropores, in the thickness direction in a manner such that the conductive paths are insulated from one another. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102141577-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9077122-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2012043449-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012078222-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013224880-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I798010-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102549731-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012038383-A1 |
| priorityDate |
2008-03-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |