http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009107564-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7168cd01942ce51cc133939074d47f61 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b66a9eb33f0d43af9c0f420bfe454ab3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_24f54aefd7a75822ce9d6a7759e20068 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_96b2ad26cb893ab8f4342503d16257b3 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T428-257 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B21-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M8-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M8-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B21-32 |
| filingDate | 2009-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a4a2b5739e3bb18ca3df9e4d82047aec http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8c4876061644f795e6e54317fd00278e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_37a51a8b2e849ab454e0f6b26f940386 |
| publicationDate | 2009-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2009107564-A1 |
| titleOfInvention | Method of, apparatus for, and program for inspecting stack body |
| abstract | A method of inspecting a stack body (50) of at least a porous layer and a dense layer comprises the first step of measuring the length of the stack body (50) before the stack body (50) is fired, the second step of measuring the length of the stack body (50) after the stack body (50) is fired, the third step of calculating a shrinkage rate of the stack body (50) based on a first measured value from the first step and a second measured value from the second step, the fourth step of determining whether the calculated shrinkage rate of the stack body (50) is acceptable or not based on the calculated shrinkage rate, the fifth step of calculating an S/N ratio of the stack body (50) based on the first measured value and the second measured value, and the sixth step of determining whether the current-voltage characteristics of the stack body (50) are acceptable or not based on the calculated S/N ratio. |
| priorityDate | 2008-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 33.