abstract |
The invention relates to an apparatus for analyzing a sample on a test element. Said apparatus comprises at least one electrically contacting component (123, 124, 125, 126, 127, 128, 129, 130, 131, 132) for transmitting power, which is suitable for establishing electric contact to at least one other component. The electrically contacting component (123, 124, 125, 126, 127, 128, 129, 130, 131, 132) is embodied as an injection-molded circuit support (MID). |