http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2006113443-A2

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filingDate 2006-04-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2006-10-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2006113443-A2
titleOfInvention Etching technique for the fabrication of thin (ai, in, ga)n layers
abstract An etching technique for the fabrication of thin (Al, In, Ga)N layers. A suitable template or substrate is selected and implanted with foreign ions over a desired area to create ion implanted material. A regrowth of a device structure is then performed on the implanted template or substrate. The top growth surface of the template is bonded to a carrier wafer to created a bonded template/carrier wafer structure. The substrate is removed, as is any residual material, to expose the ion implanted material. The ion implanted material on the bonded template/carrier wafer structure is then exposed to a suitable etchant for a sufficient time to remove the ion implanted material.
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