http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2006095425-A1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_261f32ac775df6609c61ea9d33a49486
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c1055b14e7e81fd8747227b84567696e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_22a992db4224859ae79d57e9cf8e4c12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_21fbd7705c077cee1dc3fc8fabe298f3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c708f9dcebe03e3060bcfbf385f47cca
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5dedaff1c36756cd35d0e788c94f6642
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L28-55
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B53-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B53-30
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-105
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822
filingDate 2005-03-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ebce5eb32cee5ecf3005aca7be470093
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d16fe65b433d58532af7564515334a19
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_81c0d794bc44ab781e066796d88677c0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d48f89bb9cdddff50d8d1e38b9cdb106
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ed9e798984b5acf6400e9a9f7519ed54
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e5ba92bbbe31015d1a6cc106a8be12e8
publicationDate 2006-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2006095425-A1
titleOfInvention Nonvolatile semiconductor storage and method for manufacturing same
abstract Disclosed is a nonvolatile semiconductor storage comprising a capacitor (32) having a first electrode (26) formed on a substrate (10), a single crystal ferroelectric layer (28) formed on the first electrode, and a second electrode (30) formed on the ferroelectric layer. Since an extremely stable single crystal ferroelectric material is used as the material for the ferroelectric layer (28) of the capacitor (32), the capacitor (32) hardly deteriorates even when polarization reversals are repeated. Consequently, there can be obtained a nonvolatile semiconductor storage having a very long life. In addition, an extremely high remanent polarization (Pr) can be obtained since a single crystal ferroelectric material is used as the material for the ferroelectric layer (28) of the capacitor (32). Consequently, a sufficiently large signal can be obtained even when the capacitor (32) is miniaturized, thereby enabling to obtain a nonvolatile semiconductor storage with a high degree of integration.
priorityDate 2005-03-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004165351-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08227980-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004504749-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID159431962
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID454294634
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID450662951
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23956
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID68383
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID416641266
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23665650
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID449160084
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID450022495
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID159405

Total number of triples: 39.