| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6c4f2676a67fae193c4f5a2c9d50c303
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0eff632cf7b2763e23e5e35cc71ca8f2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_23a4e0c875bf1ac2b8a3b76517de6c7d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_32b86d34217971b74281c142926a756b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8e19f28f993d24adcd12ea16ef674b1d |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-45
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-54373 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B7-00 |
| filingDate |
2006-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7c3a94ffbf7d68d85da5a35a89c9e67f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_703bfdf85dd3308c15cc4c7b09dedc02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6fb6d3aecac16862b23a05212cc4bccf
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1addd195fa12338c0a5634dcfda648eb |
| publicationDate |
2006-08-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2006083911-A2 |
| titleOfInvention |
Method and apparatus for phase contrast quadrature interferometric detection of an immunoassay |
| abstract |
A phase contrast quadrature interferometric method and apparatus for determining the presence or absence of a target analyte in a sample, comprising using a laser beam having a wavelength h and a waist w, to probe at least a portion of a substrate having a reflecting surface that has been exposed to the sample. The reflecting surface includes at least a first region having a layer of recognition molecules specific to the target analyte and a second region that does not include a layer of recognition molecules specific to the target analyte. The method further comprises measuring a time dependent intensity on a photodetector of a substantiall only first quadrature at one of a pair of quadrature angles, of a reflected diffraction signal of the probe beam while probing the first region and the second region. |
| priorityDate |
2005-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |