http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2005106508-A2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c025e75bf547011f3568170e3440cee1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_68c3c33d06471439096f6c52f3c7f4eb http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2a819eda0adf22936a52362eeebb9fb4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_67005d3af95293a568c6f258933e11f7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7a4e2ca0068d6b4b0f747921cc6800b9 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-317 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-30433 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-153 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-304 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-3056 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-315 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03C5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-315 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-305 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-304 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R19-00 |
| filingDate | 2005-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_353bb5e70e62508912b55743bb0cea44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2cdb8a779ea1737d2690c5fb3e022cc6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_922ee58d87769ef8fa938df0223ec88a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b36febf7231ae61250934405c695cfae |
| publicationDate | 2005-11-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2005106508-A2 |
| titleOfInvention | Diagnostic system for profiling micro-beams |
| abstract | An apparatus for characterization of a micro beam comprising a micro modified Faraday cup assembly (102) including a first layer (201) of material, a second layer (202) of material operatively connected to the first layer of material, a third layer (203) of material operatively connected to the second layer (202) of material, and a fourth layer (204) of material operatively connected to the third layer (203) of material. The first layer (201) of material comprises an electrical conducting material and has at least one first layer radial slit extending through the first layer. An electrical ground is connected to the first layer. The second layer (202) of material comprises an insulating material and has at least one second layer radial slit corresponding to the first layer radial slit in the first layer of material. The second layer radial slit extends through the second layer. The third layer of material comprises a conducting mAn apparatus for characterization of a micro beam comprising a micro modified Faraday cup assembly including a first layer of material, a second layer of material operatively connected to the first layer layer of material, a third layer of material operatively connected to the second layer of material, and a fourth layer of material operatively connected to the third layer of material. The first layer of material comprises an electrical conducting material and has at least one first layer radial slit extending through the first layer. An electrical ground is connected to the first layer. The second layer of material comprises an insulating material and has at least one second layer radial slit corresponding to the first layer radial slit in the first layer of material. The second layer radial slit extends through the second layer. The third layer of material comprises a conducting material and has at least one third layer radial slit corresponding to the second layer radial slit in the second layer of material. The third layer radial slit extends through the third layer. The fourth layer of material comprises an electrical conducting material but does not have slits. An electrically measuring device is connected to the fourth layer. The micro modified Faraday cup assembly is positioned to be swept by the micro beam. |
| priorityDate | 2004-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 36.