http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2005084352-A2

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_66c5e5cf50afed42977281993daeac0b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0332d288b73ae34f372ef93b9f5220d3
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-04
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filingDate 2005-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_62f03e8b64dac007986f852281909749
publicationDate 2005-09-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2005084352-A2
titleOfInvention Dual energy radiation scanning of objects
abstract In one embodiment, a method of examining contents of an object (410) is disclosed comprising scanning an object (410) at first and second radiation energies, detecting radiation at the first and second energies, and calculating a function of the radiation detected at the first and second energies. The function may be calculated for corresponding portions of the object (410). It is determined whether the object (410) at least potentially comprises high atomic number material having an atomic number greater than a predetermined atomic number based, at least in part, on the function. The function may be a ratio. The function may be compared to a second function, which may be a threshold having a value based, at least in part, on material of the predetermined atomic number. The second function may be the same as the first function.
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priorityDate 2004-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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