http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2004097929-A2

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filingDate 2004-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d1120a41bf81c5cdbbcb01b7239a688a
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publicationDate 2004-11-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2004097929-A2
titleOfInvention Method and apparatus for reduction of defects in wet processed layers
abstract The present invention provides a method and apparatus for wet processing of a conductive layer using a degassed process solution such as a degassed electrochemical deposition solution, a degassed electrochemical polishing solution, a degassed electroless deposition solution, and a degassed cleaning solution. The technique includes degassing the process solution before delivering the degassed process solution to a processing unit or degassing the process solution in-situ, within the processing unit.
priorityDate 2003-04-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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