Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dc05229904be2987713acc8b41db7cd3 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0395 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0046 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-004 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-039 |
filingDate |
2004-02-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9971c32a521d434a1deb4556016716ac http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d0c6443508a7f197ccdd4eb37dc284ca http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9642f9d8f9fdf8da34bc80fdebdb1408 |
publicationDate |
2004-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-2004074928-A2 |
titleOfInvention |
Photoresist composition for deep ultraviolet lithography |
abstract |
The present invention relates to a photoresist composition comprising a photoacid generator and at least one polymer comprising at least one unit as described by structure (1). The invention also relates to a process for imaging the photoresist composition of the present invention, and to a process of making the polymer in the presence of an organic base. |
priorityDate |
2003-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |