| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9af2eeb17ce1d4589b49f738d441ea96
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c0b9553bfd2e51b2776db32850db242e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_687f46d6f13ba0621a6e3758e9cb2d15 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
| filingDate |
2002-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bee887b6f6fabaa432db11e1e20ef546
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_83a339c59fd7536a5396571ed4fc17f7 |
| publicationDate |
2003-03-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-03021244-A1 |
| titleOfInvention |
X-ray fluorescence measuring system and methods for trace elements |
| abstract |
An X-ray fluorescence measuring system and related measuring methods are disclosed. the system using X-ray energy at a level of less than 80 KeV may be directed toward a material, such as coal. The energy fluoresced may be detected (10) and used to measure the elemental composition of the material, including trace elements. The material may be moving or stationary. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2095097-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2095097-A4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2005100963-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104215651-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2572569-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2572569-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2227687-A2 |
| priorityDate |
2001-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |