Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5ed7daf034629c878bca78561d29594c http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fd94bff6abb416365e0686b6fc30fb95 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_93d4be1122ac19a1f6b4b45a73b1645f http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_537be7901f69e464d88cc9edfd880d9c http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_057374ebbcd19a642c1ce123af7deb9f |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-36 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-42 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-62 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-38 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-36 |
filingDate |
2002-05-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_033bc95ec67496b405c1aaf30039fabd http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8e3862fadcffb48a116bdc79415dfdc6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_69e7549e5f086f2435ca3983ef0fc938 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3f8a0ab3e2a6f8918b90e7fcadf8853a |
publicationDate |
2002-11-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-02091426-A1 |
titleOfInvention |
Mass spectrometer |
abstract |
A new mass spectrometer (10) is described in which sample molecules (26) are ionized and caused to oscillate to and fro by reflecting electric fields established between two electrodes (12, 14) in a vacuum chamber (20). A mesh electron producing electrode (16) is located between reflector electodes (12, 14) and produces electrons by secondary emission on each pass of the oscillating ions when some of those ions strike the mesh. The secondary eldctrons are detected (18) after passage through reflector electrode (12), which is alos a mesh. The frequency of oscillation of the ions depends upon their mass and from the frequency distribution of the signals from each electron production event it is possible to identify the ions of different masses. The invention allows for a much more compact spectrometer instrument compared toa Time of flight Mass Spectrometer which is less expensive than a Fourier Transform Mass emplying ion-cyclotron resonance. |
priorityDate |
2001-05-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |