http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-02071082-A2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b7317808024e524eea40a6c5a5ad6a22 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318544 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318536 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3183 |
| filingDate | 2002-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e33475eb35037d38acbf6cb3734b688 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_82e13c6af9be7f303aec47ddf536f178 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d707a82fa27de5802d260fea098a7210 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4300b52e2d9bbc93e28bda8def95a886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b77da45e2cdbf7ea5a9f4097643eae3 |
| publicationDate | 2002-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-02071082-A2 |
| titleOfInvention | Method for testing a testable electronic device |
| abstract | A method for testing a testable electronic device having a first and a second plurality of test arrangements, e.g. scan chains, is disclosed. A first shift register (110) is used in parallel with a second shift register (130) to time-multiplex a first test vector (102) and a second test vector (104) into a number of smaller test vectors (102a-c; 104a-c) for provision to the first and second plurality of test arrangements. By varying the size of the first shift register (110) and the second shift register (130) a trade-off between the number of pins of the electronic device to be contacted and the required test time can be made. Preferably, first shift register (110) is coupled to a first buffer register (120) and second shift register (130) is coupled to a second buffer register (140) for enhanced test data stability. First shift register (110) and second shift register (130) can be partitions of a larger shift register, e.g. a boundary scan chain. The method can also be used in a reverse way by time-demultiplexing test result vectors into a single vector at the output side of the testable electronic device. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100768549-B1 |
| priorityDate | 2001-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 42.