| abstract |
The present invention provides a method for quantifying structural defects of a coating composition on a given substrate (1), where certain structural defect-inducing tests are performed. In this method, a coating formulation is doped with a colorimetric or luminescent material. Concentration of the material depends on the quantum efficiency, excitation and emission wavelengths, and employed detection techniques, and can range from about 1 fM to about 1 mM. Before, during and/or after such tests, the coating is illuminated (4) with a wavelength of radiation at which the reflected (5) or transmitted color or emitted luminescence of the material in the coating is detectable with an optical detector (7) or by visual inspection. In this fashion, the percentage of failure of the coating can be quantified as well as the level of interdiffusion of coating into substrate or substrate into coating. The method of the invention is thus particularly well-suited for the combinatorial analysis of an array of coating samples. Additionally, when the structural defect-inducing material test is being performed, the removed coating material can be analyzed in like fashion. |