| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e4a153a7031b1fcc6565ba403a20f681
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0657a3a45f0d2d7b9390a0b9ffae7516
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4d7efdc1ce2d7474e9eff812bc73ee56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c8c6db791c9756bbf46f13d7cda839be
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6fdc72f2536fa132dd068cd2cc4d394a |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-622
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-62 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-64 |
| filingDate |
2002-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_458dc852a67aaf6d33218d20893daea4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7ec273230acddc1015d599e5c2c4aa4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_94448b37732b0213fd18bd9dc751eae2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4eee706475dee329316b22c4fe114b7f |
| publicationDate |
2002-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-02054058-A1 |
| titleOfInvention |
A method for measuring the concentration of impurities in helium by ion mobility spectrometry |
| abstract |
A method for the quantitative analysis of the concentration of impurities in helium by means of ion mobility spectrometry is described, which consists in using purified argon together with the helium which has to be analyzed for forming the sample, or pure argon as counterflow gas in the separation zone of the instrument, or finally helium-purified argon mixtures both for the sample gas and for the counterflow gas. |
| priorityDate |
2001-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |