http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-0192899-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e59ec941d57d30a8306758916814a894 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9d527f9a5c3e991a1797de3518a88d14 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R13-345 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R13-34 |
| filingDate | 2001-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ee5703a193b5bfd9a698d1d1a4b49e8b |
| publicationDate | 2001-12-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-0192899-A1 |
| titleOfInvention | Sampling digitizer, method for sampling digitizing, and semiconductor integrated circuit test device with sampling digitizer |
| abstract | A sampling digitizer, comprising a sampling head (11), a clock generating part (12), a digitizer (13), and a trigger circuit (14), wherein clock signals from the clock generating part (12) are supplied also to a delay element (15) to switch a changeover switch (16), using trigger signals from the trigger circuit, from an output from the delay element (15) to a clock signal not passing through the delay element (15) so as to supply the clock signals to the sampling head (11). |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017122718-A |
| priorityDate | 2000-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 34.