http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-0150515-A1

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_73ebc284a55d5daf0e209d6186c9e65c
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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78612
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
filingDate 2001-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7a9e18214b61f80c2d00d384cfb69736
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publicationDate 2001-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-0150515-A1
titleOfInvention Thin-film transistor
abstract In a TFT (10), a channel region (15) facing a gate electrode (14) through a gate insulating film (12), a source electrode (16) connected to the channel region (15) and a drain region (17) connected to the channel region (15) on the side opposite this source region (16) are formed in a polycrystal semiconductor film (100) that was patterned in island forms. In the channel region (15), a recombination center (150) is formed for capturing a small number of carriers (holes) by impurities such as inert-gas, metals, Group III elements, Group IV elements and Group V elements introduced to a predetermined region in this channel region (15), or by defects generated due to the introduction of these impurities. The invention thus provides an arrangement restraining bipolar transistor type behavior, to stabilize saturation current and to provide a TFT that can improve reliability.
priorityDate 2000-01-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 22.