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filingDate 2014-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-04-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8c88d860ae0815a5db6ecaa53d56634b
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publicationDate 2018-04-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9952041-B2
titleOfInvention Assessing alignment of top and bottom ends of TSVs and characterizing microfabrication process
abstract A method for characterizing a microfabrication process and the product thereof is described. A substrate having TSV's formed therein is assessed by determining the geometries and positions of the top and bottom ends of a TSV. Individual TSV's as well as the entire pattern of TSV's formed in a substrate may be assessed.
priorityDate 2013-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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