Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_82a9e22a923eca64a02a97f0dfb493ed |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-456 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28052 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28518 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-93 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66174 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-4933 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-456 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66189 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-285 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-45 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-49 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-93 |
filingDate |
2017-02-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2018-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8a514d1618c8d92b91b6cdd14115b147 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6cc4e506f771e63168101bbb64936d35 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a83b9a638f56f119a1b6b2615d04697e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f697b3938c77a25dd44147f4bffd7f17 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9df316072d9cc2b91ff4fd80d9dbfdc8 |
publicationDate |
2018-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-9882066-B1 |
titleOfInvention |
Transcap manufacturing techniques without a silicide-blocking mask |
abstract |
Certain aspects of the present disclosure provide a semiconductor variable capacitor. The semiconductor variable capacitor generally includes a first non-insulative region disposed above a semiconductor region, and a second non-insulative region disposed adjacent to the semiconductor region. In certain aspects, the semiconductor variable capacitor also includes a first silicide layer disposed above the second non-insulative region, wherein the first silicide layer overlaps at least a portion of the semiconductor region. In certain aspects, a control region may be disposed adjacent to the semiconductor region such that a capacitance between the first non-insulative region and the second non-insulative region is configured to be adjusted by varying a control voltage applied to the control region. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10580908-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10181533-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10211347-B2 |
priorityDate |
2017-02-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |