http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9869711-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4999165d35444744a06267a3502a6a36 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2621 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2014-05-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2018-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8ad92220fc90b343e5b2826bcf4bc910 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5f04f50c9a11f02b56c0c166dfbc658 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a0092e645c9e367e5b3b2f241c584218 |
| publicationDate | 2018-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-9869711-B2 |
| titleOfInvention | Method for evaluating performance of plasma wave transistor |
| abstract | A method for evaluating the performance of a plasma transistor comprises: setting a plasma wave velocity, which is adjusted by a gate overdrive voltage, as a first axis; setting an electronic drift velocity, which is adjusted by a drain-to-source voltage, as a second axis; setting a channel length as a third axis; and checking whether the plasma wave transistor is operated as a terahertz emitter according to a change in the performance parameter value of the plasma wave transistor on the basis of a relational expression among the first axis, the second axis, and the third axis. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10684320-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018080974-A1 |
| priorityDate | 2014-02-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.