http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9861277-B2

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filingDate 2014-06-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_73f193b52ea3684d5a3b62aadac7a4f3
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publicationDate 2018-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9861277-B2
titleOfInvention Wavefront analyser
abstract Interferometry-based methods and apparatus are presented for analyzing one or more wavefronts from a sample, in which the sample wavefronts are interfered with two or more reference wavefronts to produce two or more interferograms in a sufficiently short time period for the interferograms to be captured in a single exposure of an image capture device such as a CCD array. Each interferogram has a unique carrier frequency dependent on the angle between a respective pair of sample and reference wavefronts. In certain embodiments multiple sample and/or reference wavefronts are generated using scanning mirrors, while in other embodiments utilizing multi-wavelength beams multiple sample and/or reference wavefronts are generated with wavelength dispersive elements. The methods and apparatus are suitable for measuring aberrations at one or more positions on the retina of an eye.
priorityDate 2013-06-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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