http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9846178-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9df682e93c78b379d4bb9efe390166ef |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q30-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q20-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-18 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q30-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q20-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-22 |
| filingDate | 2016-08-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2017-12-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_76c510f1a47b3d3edb85964926746bdf http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0edaeeebc475ba5916f79a315648bc0b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0362c6a03c7a156f0198170a37ca36ee http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_feff20f1157320a3bc0fb6b6b99dd67b |
| publicationDate | 2017-12-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-9846178-B2 |
| titleOfInvention | Chemical nano-identification of a sample using normalized near-field spectroscopy |
| abstract | Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction. Nano-identification is realized with sub-50 nm resolution and, optionally, in the mid-infrared portion of the spectrum. |
| priorityDate | 2013-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.