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filingDate 2014-08-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2017-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41f50c9308f1dcf204a16f7025b51850
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publicationDate 2017-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9798240-B2
titleOfInvention Controlling photo acid diffusion in lithography processes
abstract Methods and apparatuses for minimizing line edge/width roughness in lines formed by photolithography are provided. The random diffusion of acid generated by a photoacid generator during a lithography process contributes to line edge/width roughness. Methods disclosed herein apply an electric field, a magnetic field, and/or a standing wave during photolithography processes. The field and/or standing wave application controls the diffusion of the acids generated by the photoacid generator along the line and spacing direction, preventing the line edge/width roughness that results from random diffusion. Apparatuses for carrying out the aforementioned methods are also disclosed herein.
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priorityDate 2014-07-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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