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filingDate 2009-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2017-08-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9739597-B2
titleOfInvention Method of authenticating a polymer film by thickness measurement with a white light interferometer
abstract A method of authenticating a polymer film comprises measuring the thickness of a layer therein by white light interferometry and/or measuring the birefringence of a layer therein. The method, and devices to carry out the method, may be used in security applications, for example to test for counterfeit bank notes.
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