| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_23a4e0c875bf1ac2b8a3b76517de6c7d |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P70-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-345
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-058
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-0525 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-0413
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-0436
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-72 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-058
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-0525 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N25-72 |
| filingDate |
2012-10-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2017-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_94445afffd4e520acc62a5f6fbca1952
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_597894919930f1b22a932179e6953d0a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0abc05cb51a0387ee1a9d9d9a97436d3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_113b90f44b89a6718a74507635d3cf9b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3855125799c8833f862c0d0a4a5976fe
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4a7e3c94569300a5bab7a50c8c0faa73
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d4aba94ddbef146f263b186de057fcd0 |
| publicationDate |
2017-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-9689820-B2 |
| titleOfInvention |
Thermography for battery component quality assurance |
| abstract |
Methods and apparatus for the detection of irregularities in a thin film by measurement of transient thermal response. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017184522-A1 |
| priorityDate |
2011-10-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |