| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_10d22ac72438be96bc3e9a16ad3fe25d |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-95638
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-046
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30148
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10116
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-203 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-001
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-84
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-751
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06K9-6202 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-203
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-956 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-84 |
| filingDate |
2014-09-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2017-05-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c3230fabbcdebabbea6aded5c5b30b4f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b3f80d83381c43e36ebcc406e4eb44df
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5878bfa96220de3b9ca13635fd63c97f |
| publicationDate |
2017-05-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-9646373-B2 |
| titleOfInvention |
System and method for counterfeit IC detection |
| abstract |
A method for counterfeit IC detection includes: providing a computer, an optical and an X-ray imager; optically imaging a package of one or more ICs; pattern matching the package image to identify an IC type; selecting one or more reference images from a reference library; X-ray imaging one or more ICs; performing in any order: comparing an internal lead frame structure of the one or more ICs to images from the reference library to determine a first numerical indicator; and determining a composition of the lead frame of the one or more ICs and to a corresponding composition from the reference library to determine a second numerical indicator; calculating an indication of authenticity based on the first numerical indicator and the second numerical indicator; and accepting or rejecting the one or more ICs based on the indication of authenticity. A system for counterfeit IC detection is also described. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11063000-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106415192-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106415192-A |
| priorityDate |
2013-09-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |