Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_73ebc284a55d5daf0e209d6186c9e65c |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04R17-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B06B1-0644 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-1071 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-4444 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G10K9-122 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L41-0825 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G10K13-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L41-053 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B06B1-0622 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01S15-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-88 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B06B1-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B8-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L41-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L41-053 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01S15-02 |
filingDate |
2016-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2017-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dd3da6928054baae9c3e63acb71fc300 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fceee20f22f51db9f55ba60359b17a6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_77c4fa3d1ea733067f3b14264cfe7baf |
publicationDate |
2017-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-9561527-B2 |
titleOfInvention |
Ultrasonic transducer, ultrasonic probe, and ultrasonic examination device |
abstract |
An ultrasonic transducer includes a substrate, a supporting film disposed on the substrate, and a piezoelectric element disposed on the supporting film. The substrate includes an opening. The piezoelectric element is disposed on an area that overlaps the opening in a plan view in a thickness direction of the substrate. A thickness of the supporting film at an area that overlaps the piezoelectric element in a plan view of the supporting film is smaller than a thickness of the supporting film at a different area different from the area that overlaps the piezoelectric element. |
priorityDate |
2012-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |