Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ede47b877b6df9c8d0c494cd66f45ae8 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06772 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R35-005 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07342 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R35-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate |
2014-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2017-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_749236e3a90cd52cf41254da9f68447b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6fbc84832e53953f3577376244f8711c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49f48a2c17e763e805b4bbd0ac3197d4 |
publicationDate |
2017-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-9535094-B2 |
titleOfInvention |
Vertical/horizontal probe system and calibration kit for the probe system |
abstract |
Disclosed is a probe system. The probe system includes a support member configured to grasp a circuit board to be tested vertically to a base plate, a probe-tip member having a probes that are in contact with a conductive pattern of the circuit board, a guide-arm member coupled with the probe-tip member and configured to move the probe-tip member to a desired position, and a network analyzer electrically connected with the probe of the probe-tip member and configured to analyze electromagnetic characteristics of the conductive pattern. Further disclosed is a calibration kit which that is applicable when calibrating a multi-port of the network analyzer using the probe system that is disclosed. |
priorityDate |
2013-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |