http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9535094-B2

Outgoing Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2014-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2017-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_749236e3a90cd52cf41254da9f68447b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6fbc84832e53953f3577376244f8711c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49f48a2c17e763e805b4bbd0ac3197d4
publicationDate 2017-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9535094-B2
titleOfInvention Vertical/horizontal probe system and calibration kit for the probe system
abstract Disclosed is a probe system. The probe system includes a support member configured to grasp a circuit board to be tested vertically to a base plate, a probe-tip member having a probes that are in contact with a conductive pattern of the circuit board, a guide-arm member coupled with the probe-tip member and configured to move the probe-tip member to a desired position, and a network analyzer electrically connected with the probe of the probe-tip member and configured to analyze electromagnetic characteristics of the conductive pattern. Further disclosed is a calibration kit which that is applicable when calibrating a multi-port of the network analyzer using the probe system that is disclosed.
priorityDate 2013-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 23.