http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9531371-B2

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filingDate 2014-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2016-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9531371-B2
titleOfInvention Restoring OFF-state stress degradation of threshold voltage
abstract A method for at least partially compensating for a change in threshold voltage level of a FET transistor induced by OFF-state stress degradation includes determining a signal indicative of a change in threshold voltage level of the FET with respect to a reference threshold voltage level, and applying a restoration signal to the FET. This restoration signal is adapted for shifting the threshold voltage level of the FET in a direction having opposite sign with respect to the change in threshold voltage level. Applying the restoration signal further includes taking into account the signal indicative of the change in threshold voltage level.
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