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publicationDate 2016-12-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9513328-B2
titleOfInvention Systems and methods for eliminating measurement artifacts of external quantum efficiency of multi-junction solar cells
abstract A pulsed voltage bias method and/or pulsed light bias method may be used to reduce, minimize, and/or eliminate external quantum efficiency measurement artifacts of multi-junction solar cells, for example artifacts caused by the shunt effect. In this manner, multi-junction solar cells may be designed and constructed with improved performance, efficiency, and the like.
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